Analysis of NBTI effects on read and write operations of 6t SRAM cells

Negative Bias Temperature Instability (NBTI) is an important reliability issue in CMOS devices that affects the performance of CMOS-based circuits. Therefore, it is vital to comprehend the impact of different defect mechanisms and wide operating conditions about stress and recovery time on the circu...

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Bibliographic Details
Main Authors: Zahari, Hashimah, Hussin, Hanim, Muhamad, Maizan, Soin, Norhayati, Abdul Wahab, Yasmin
Format: Article
Published: Taylor's University 2022
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Online Access:http://eprints.um.edu.my/43927/
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