Computation and analysis of output error probability for C17 benchmark circuit using bayesian networks error modeling

• Main Authors: Khalid, U., Anwer, J., Singh, N., Hamid, N.H., Asirvadam, V.S.
• Format: Conference or Workshop Item
• Published: 2010
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://eprints.utp.edu.my/4635/1/compuC17.pdf; http://eprints.utp.edu.my/4635/

The reliability of digital circuits is in question since the new scaled transistor technologies continue to emerge. The major factor deteriorating the circuit performance is the random and dynamic nature of errors encountered during its operation. Output-error probability is the direct measure of ci...