A Review on Key Issues and Challenges in Devices Level MEMS Testing
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Hindawi Limited
2016
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Online Access: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-84960977862&doi=10.1155%2f2016%2f1639805&partnerID=40&md5=ff7593e8cb5ee61cbd744792bdb0bd35 http://eprints.utp.edu.my/24250/ |
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my.utp.eprints.242502021-08-23T13:25:58Z A Review on Key Issues and Challenges in Devices Level MEMS Testing Shoaib, M. Hamid, N.H. Malik, A.F. Zain Ali, N.B. Tariq Jan, M. Hindawi Limited 2016 Article NonPeerReviewed https://www.scopus.com/inward/record.uri?eid=2-s2.0-84960977862&doi=10.1155%2f2016%2f1639805&partnerID=40&md5=ff7593e8cb5ee61cbd744792bdb0bd35 Shoaib, M. and Hamid, N.H. and Malik, A.F. and Zain Ali, N.B. and Tariq Jan, M. (2016) A Review on Key Issues and Challenges in Devices Level MEMS Testing. Journal of Sensors, 2016 . http://eprints.utp.edu.my/24250/ |
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Shoaib, M. Hamid, N.H. Malik, A.F. Zain Ali, N.B. Tariq Jan, M. |
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Shoaib, M. Hamid, N.H. Malik, A.F. Zain Ali, N.B. Tariq Jan, M. A Review on Key Issues and Challenges in Devices Level MEMS Testing |
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Shoaib, M. Hamid, N.H. Malik, A.F. Zain Ali, N.B. Tariq Jan, M. |
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Shoaib, M. |
title |
A Review on Key Issues and Challenges in Devices Level MEMS Testing |
title_short |
A Review on Key Issues and Challenges in Devices Level MEMS Testing |
title_full |
A Review on Key Issues and Challenges in Devices Level MEMS Testing |
title_fullStr |
A Review on Key Issues and Challenges in Devices Level MEMS Testing |
title_full_unstemmed |
A Review on Key Issues and Challenges in Devices Level MEMS Testing |
title_sort |
review on key issues and challenges in devices level mems testing |
publisher |
Hindawi Limited |
publishDate |
2016 |
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https://www.scopus.com/inward/record.uri?eid=2-s2.0-84960977862&doi=10.1155%2f2016%2f1639805&partnerID=40&md5=ff7593e8cb5ee61cbd744792bdb0bd35 http://eprints.utp.edu.my/24250/ |
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13.19449 |