Enhancement in IEEE 1500 Standard for At-Speed Functional Testing
System on chip (SOC) makes it possible to design a complex system in a short period of time by using intellectual property (IP) blocks. The complexity of the design makes testing of the SOC a very difficult task. To alleviate this test access issue, IEEE 1500 has been introduced. It has become a wid...
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2014
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my.utp.eprints.119662017-01-19T08:21:00Z Enhancement in IEEE 1500 Standard for At-Speed Functional Testing Ali, Ghazanfar Hussin, Fawnizu Azmadi Zain Ali, Noohul Basheer Hamid, Nor Hisham System on chip (SOC) makes it possible to design a complex system in a short period of time by using intellectual property (IP) blocks. The complexity of the design makes testing of the SOC a very difficult task. To alleviate this test access issue, IEEE 1500 has been introduced. It has become a widely used option because of its completeness and easy to use approach, but this standard is only supported in the test mode as it stays transparent in normal functional mode. In this paper, an enhancement of the existing IEEE 1500 standard for functional testing, during functional mode of operation, is proposed. 2014 Conference or Workshop Item PeerReviewed application/pdf http://eprints.utp.edu.my/11966/1/06869507.pdf Ali, Ghazanfar and Hussin, Fawnizu Azmadi and Zain Ali, Noohul Basheer and Hamid, Nor Hisham (2014) Enhancement in IEEE 1500 Standard for At-Speed Functional Testing. In: 5th International Conference on Intelligent and Advanced Systems, ICIAS 2014, 3-5 June 2014, Kuala Lumpur Malaysia. http://eprints.utp.edu.my/11966/ |
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System on chip (SOC) makes it possible to design a complex system in a short period of time by using intellectual property (IP) blocks. The complexity of the design makes testing of the SOC a very difficult task. To alleviate this test access issue, IEEE 1500 has been introduced. It has become a widely used option because of its completeness and easy to use approach, but this standard is only supported in the test mode as it stays transparent in normal functional mode. In this paper, an enhancement of the existing IEEE 1500 standard for functional testing, during functional mode of operation, is proposed. |
| format |
Conference or Workshop Item |
| author |
Ali, Ghazanfar Hussin, Fawnizu Azmadi Zain Ali, Noohul Basheer Hamid, Nor Hisham |
| spellingShingle |
Ali, Ghazanfar Hussin, Fawnizu Azmadi Zain Ali, Noohul Basheer Hamid, Nor Hisham Enhancement in IEEE 1500 Standard for At-Speed Functional Testing |
| author_facet |
Ali, Ghazanfar Hussin, Fawnizu Azmadi Zain Ali, Noohul Basheer Hamid, Nor Hisham |
| author_sort |
Ali, Ghazanfar |
| title |
Enhancement in IEEE 1500 Standard for At-Speed Functional Testing |
| title_short |
Enhancement in IEEE 1500 Standard for At-Speed Functional Testing |
| title_full |
Enhancement in IEEE 1500 Standard for At-Speed Functional Testing |
| title_fullStr |
Enhancement in IEEE 1500 Standard for At-Speed Functional Testing |
| title_full_unstemmed |
Enhancement in IEEE 1500 Standard for At-Speed Functional Testing |
| title_sort |
enhancement in ieee 1500 standard for at-speed functional testing |
| publishDate |
2014 |
| url |
http://eprints.utp.edu.my/11966/1/06869507.pdf http://eprints.utp.edu.my/11966/ |
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1738655994772193280 |
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13.18916 |