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Resistive Open Faults Detectability Analysis and Implications for Testing Low Power Nanometric ICs

Resistive open faults (ROFs) represent common manufacturing defects in IC interconnects and result in delay faults that cause timing failures and reliability risks. The nonmonotonic dependence of ROF-induced delay faults on the supply voltage (VDD) poses a concern as to whether single-VDD testing wi...

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Main Authors: Mohammadat, Mohamed Tag Elsir, Zain Ali , Noohul Basheer, Hussin, Fawnizu Azmadi, Zwolinski, Mark
Format: Article
Published: IEEE 2015
Online Access:http://eprints.utp.edu.my/11942/1/06782673.pdf
http://eprints.utp.edu.my/11942/
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spelling my.utp.eprints.119422017-01-19T08:20:58Z Resistive Open Faults Detectability Analysis and Implications for Testing Low Power Nanometric ICs Mohammadat, Mohamed Tag Elsir Zain Ali , Noohul Basheer Hussin, Fawnizu Azmadi Zwolinski, Mark Resistive open faults (ROFs) represent common manufacturing defects in IC interconnects and result in delay faults that cause timing failures and reliability risks. The nonmonotonic dependence of ROF-induced delay faults on the supply voltage (VDD) poses a concern as to whether single-VDD testing will suffice for low power nanometric designs. Our analysis shows multi-VDD tests could be required, depending on the test speed. This knowledge can be exploited in small delay fault testing to reduce the chances of test escapes while minimizing cost. IEEE 2015 Article PeerReviewed application/pdf http://eprints.utp.edu.my/11942/1/06782673.pdf Mohammadat, Mohamed Tag Elsir and Zain Ali , Noohul Basheer and Hussin, Fawnizu Azmadi and Zwolinski, Mark (2015) Resistive Open Faults Detectability Analysis and Implications for Testing Low Power Nanometric ICs. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 23 (3). pp. 580-583. ISSN 1063-8210 http://eprints.utp.edu.my/11942/
institution Universiti Teknologi Petronas
building UTP Resource Centre
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Petronas
content_source UTP Institutional Repository
url_provider http://eprints.utp.edu.my/
description Resistive open faults (ROFs) represent common manufacturing defects in IC interconnects and result in delay faults that cause timing failures and reliability risks. The nonmonotonic dependence of ROF-induced delay faults on the supply voltage (VDD) poses a concern as to whether single-VDD testing will suffice for low power nanometric designs. Our analysis shows multi-VDD tests could be required, depending on the test speed. This knowledge can be exploited in small delay fault testing to reduce the chances of test escapes while minimizing cost.
format Article
author Mohammadat, Mohamed Tag Elsir
Zain Ali , Noohul Basheer
Hussin, Fawnizu Azmadi
Zwolinski, Mark
spellingShingle Mohammadat, Mohamed Tag Elsir
Zain Ali , Noohul Basheer
Hussin, Fawnizu Azmadi
Zwolinski, Mark
Resistive Open Faults Detectability Analysis and Implications for Testing Low Power Nanometric ICs
author_facet Mohammadat, Mohamed Tag Elsir
Zain Ali , Noohul Basheer
Hussin, Fawnizu Azmadi
Zwolinski, Mark
author_sort Mohammadat, Mohamed Tag Elsir
title Resistive Open Faults Detectability Analysis and Implications for Testing Low Power Nanometric ICs
title_short Resistive Open Faults Detectability Analysis and Implications for Testing Low Power Nanometric ICs
title_full Resistive Open Faults Detectability Analysis and Implications for Testing Low Power Nanometric ICs
title_fullStr Resistive Open Faults Detectability Analysis and Implications for Testing Low Power Nanometric ICs
title_full_unstemmed Resistive Open Faults Detectability Analysis and Implications for Testing Low Power Nanometric ICs
title_sort resistive open faults detectability analysis and implications for testing low power nanometric ics
publisher IEEE
publishDate 2015
url http://eprints.utp.edu.my/11942/1/06782673.pdf
http://eprints.utp.edu.my/11942/
_version_ 1738655991656873984
score 13.160551

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