Simple calibration and dielectric measurement technique for thin material using coaxial probe
This paper focuses on the nondestructive dielectric measurement for thin dielectric material using open-ended coaxial probe. The probe calibration procedure requires only a measurement of a half-space air and three open standard kits. The measured reflection coefficient for thin sample, which is bac...
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Main Authors: | Kok, Yeow You, Yi, Lung Then |
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Format: | Article |
Language: | English |
Published: |
Institute of Electrical and Electronics Engineers Inc.
2015
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Subjects: | |
Online Access: | http://eprints.utm.my/id/eprint/55980/1/KokYeowYou2015_SimpleCalibrationandDielectricMeasurementTechnique.pdf http://eprints.utm.my/id/eprint/55980/ http://dx.doi.org/10.1109/JSEN.2015.2427873 |
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