Simple calibration and dielectric measurement technique for thin material using coaxial probe

• Main Authors: Kok, Yeow You, Yi, Lung Then
• Format: Article
• Language: English
• Published: Institute of Electrical and Electronics Engineers Inc. 2015
• Subjects: TK6570 Mobile Communication System
• Online Access: http://eprints.utm.my/id/eprint/55980/1/KokYeowYou2015_SimpleCalibrationandDielectricMeasurementTechnique.pdf; http://eprints.utm.my/id/eprint/55980/; http://dx.doi.org/10.1109/JSEN.2015.2427873

This paper focuses on the nondestructive dielectric measurement for thin dielectric material using open-ended coaxial probe. The probe calibration procedure requires only a measurement of a half-space air and three open standard kits. The measured reflection coefficient for thin sample, which is backed by metal plate, is taken with a vector network analyzer up to 7 GHz and the reflection coefficient is converted to relative dielectric constant and tangent loss via closed form capacitance model and simple calibration process.