Fabrication and characterization of stacked self-assembled In0.5Ga0.5As/GaAs quantum dots grown by MOCVD
Stacked self-assembled In0.5Ga0.5As/GaAs quantum dots (QDs) were grown using metal organic chemical vapor deposition (MOCVD). Atomic force microscopy (AFM), transmission electron microscopy (TEM) and high resolution X-ray diffraction (HR-XDR) show the effects of stacking on morphology and structure...
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| Main Authors: | , , |
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| Format: | Article |
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Trans Tech Publications, Switzerland
2014
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| Subjects: | |
| Online Access: | http://eprints.utm.my/id/eprint/52842/ https://dx.doi.org/10.4028/www.scientific.net/AMR.896.215 |
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