Deposition of Micro Contact Based Probe Cell for IC Testing by Dc Magnetron Sputtering Technique
This study presents the deposition of micro contact probe cell for IC testing deposited by dc sputtering technique on a glass substrate. Micro contact with thickness of 2800-7000 nm were deposited from Copper target at sputtering power of 125 W in argon ambient at a room temperature on a base la...
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Main Authors: | , , , |
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Format: | Article |
Language: | English |
Published: |
Maxwell Scientific Publications
2014
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Subjects: | |
Online Access: | http://eprints.utem.edu.my/id/eprint/12547/1/v7-2701-2704.pdf http://eprints.utem.edu.my/id/eprint/12547/ |
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