Deposition of Micro Contact Based Probe Cell for IC Testing by Dc Magnetron Sputtering Technique

This study presents the deposition of micro contact probe cell for IC testing deposited by dc sputtering technique on a glass substrate. Micro contact with thickness of 2800-7000 nm were deposited from Copper target at sputtering power of 125 W in argon ambient at a room temperature on a base la...

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Bibliographic Details
Main Authors: Muhammad Idzdihar , Idris, Nowshad , Amin, Faiz , Arith, Siti Amaniah, Mohd Chachuli
Format: Article
Language:English
Published: Maxwell Scientific Publications 2014
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Online Access:http://eprints.utem.edu.my/id/eprint/12547/1/v7-2701-2704.pdf
http://eprints.utem.edu.my/id/eprint/12547/
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