Avalanche multiplication and excess noise in InAs electron avalanche photodiodes at 77 K

• Main Authors: Marshall, A.R.J., Vines, P., Ker, P.J., David, J.P.R., Tan, C.H.
• Format: Article
• Language: en_US
• Published: 2017

The findings of a study of impact ionization, avalanche multiplication and excess noise in InAs avalanche photodiodes at 77 K are reported. It is shown that hole impact ionization is negligible in practical devices which continue to operate as electron avalanche photodiodes, as they do at room tempe...