Surface passivation of InAs avalanche photodiodes for low-noise infrared imaging
Avalanche photodiodes; Characterization; Diodes; Infrared imaging; Leakage currents; Nitrides; Photodiodes; Photonics; Silica; Silicon nitride; Thermography (imaging); B-staged bisbenzocyclobutene; Current-voltage characterization; InAs; Low noise; Surface leakage currents; Surface passivation; Pass...
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| 格式: | Conference Paper |
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Institute of Electrical and Electronics Engineers Inc.
2023
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