RF substrate noise characterization for CMOS 0.18?m

• Main Authors: Ishak I.S., Keating R.A., Chakrabarty C.K.
• Other Authors: 9942783300
• Format: Conference paper
• Published: 2023
• Subjects: Deep N-well (DNW); Guard ring (GR); Radio Frequency (RF); Substrate noise suppression; Design; Microwave isolators; Radio systems; Signal processing; Coupling effects; RF isolation techniques; Submicron technologies; CMOS integrated circuits

In the submicron technologies, RF noise isolation is becoming increasingly important. In this paper, the investigations of the on-chip RF isolation techniques were carried out. The chosen isolation structures were the Deep Nwell (or triple well isolation) and the P+ Guard Ring. The test structures w...