Surface passivation of InAs avalanche photodiodes for low-noise infrared imaging

• Main Authors: Ker P.J., Marshall A.R.J., Tan C.H., David J.P.R.
• Other Authors: 37461740800
• Format: Conference Paper
• Published: Institute of Electrical and Electronics Engineers Inc. 2023

Avalanche photodiodes; Characterization; Diodes; Infrared imaging; Leakage currents; Nitrides; Photodiodes; Photonics; Silica; Silicon nitride; Thermography (imaging); B-staged bisbenzocyclobutene; Current-voltage characterization; InAs; Low noise; Surface leakage currents; Surface passivation; Pass...