Effect of Halo structure variations on the threshold voltage of a 22 nm gate length NMOS transistor

This paper reports on the effects of the Halo structure variations on threshold voltage (Vth) in a 22 nm gate length high-k/metal gate planar NMOS transistor. Since the Vth is one of the important physical parameter for determining the functionality of complementary metal-oxide-semiconductor device,...

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Bibliographic Details
Main Authors: Afifah Maheran A.H., Menon P.S., Ahmad I., Shaari S.
Other Authors: 36570222300
Format: Article
Published: 2023
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