The Impact of Soft Error on C-Elements Due to Process Corner Variation and Temperature
This paper presents current injection resemble single event upset (SEU) current at the vulnerable nodes on different configurations of C-elements under two different scenarios: process corner and temperature. The objectives are to identify the vulnerable nodes due to SEU and to find the critical cha...
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| Format: | Article |
| Language: | English |
| Published: |
JASPE
2015
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| Online Access: | http://ir.unimas.my/id/eprint/13739/1/Norhuzaimin.pdf http://ir.unimas.my/id/eprint/13739/ http://www.jaspe.unimas.my/index.php/features/layouts?layout=edit&id=34 |
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