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The Impact of Soft Error on C-Elements Due to Process Corner Variation and Temperature

This paper presents current injection resemble single event upset (SEU) current at the vulnerable nodes on different configurations of C-elements under two different scenarios: process corner and temperature. The objectives are to identify the vulnerable nodes due to SEU and to find the critical cha...

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Main Author: Norhuzaimin, Julai
Format: Article
Language:English
Published: JASPE 2015
Subjects:
TK Electrical engineering. Electronics Nuclear engineering
Online Access:http://ir.unimas.my/id/eprint/13739/1/Norhuzaimin.pdf
http://ir.unimas.my/id/eprint/13739/
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spelling my.unimas.ir.137392022-02-04T03:09:45Z http://ir.unimas.my/id/eprint/13739/ The Impact of Soft Error on C-Elements Due to Process Corner Variation and Temperature Norhuzaimin, Julai TK Electrical engineering. Electronics Nuclear engineering This paper presents current injection resemble single event upset (SEU) current at the vulnerable nodes on different configurations of C-elements under two different scenarios: process corner and temperature. The objectives are to identify the vulnerable nodes due to SEU and to find the critical charges needed to flip the output from low to high (0-1) and high to low (1-0) on different configurations of C-elements. The comparisons of C-elements in term of the resistivity toward soft error are presented. JASPE 2015 Article PeerReviewed text en http://ir.unimas.my/id/eprint/13739/1/Norhuzaimin.pdf Norhuzaimin, Julai (2015) The Impact of Soft Error on C-Elements Due to Process Corner Variation and Temperature. Journal of Applied Science & Process Engineering, 2 (2). pp. 83-96. ISSN 2289-7771 http://www.jaspe.unimas.my/index.php/features/layouts?layout=edit&id=34
institution Universiti Malaysia Sarawak
building Centre for Academic Information Services (CAIS)
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Malaysia Sarawak
content_source UNIMAS Institutional Repository
url_provider http://ir.unimas.my/
language English
topic TK Electrical engineering. Electronics Nuclear engineering
spellingShingle TK Electrical engineering. Electronics Nuclear engineering
Norhuzaimin, Julai
The Impact of Soft Error on C-Elements Due to Process Corner Variation and Temperature
description This paper presents current injection resemble single event upset (SEU) current at the vulnerable nodes on different configurations of C-elements under two different scenarios: process corner and temperature. The objectives are to identify the vulnerable nodes due to SEU and to find the critical charges needed to flip the output from low to high (0-1) and high to low (1-0) on different configurations of C-elements. The comparisons of C-elements in term of the resistivity toward soft error are presented.
format Article
author Norhuzaimin, Julai
author_facet Norhuzaimin, Julai
author_sort Norhuzaimin, Julai
title The Impact of Soft Error on C-Elements Due to Process Corner Variation and Temperature
title_short The Impact of Soft Error on C-Elements Due to Process Corner Variation and Temperature
title_full The Impact of Soft Error on C-Elements Due to Process Corner Variation and Temperature
title_fullStr The Impact of Soft Error on C-Elements Due to Process Corner Variation and Temperature
title_full_unstemmed The Impact of Soft Error on C-Elements Due to Process Corner Variation and Temperature
title_sort impact of soft error on c-elements due to process corner variation and temperature
publisher JASPE
publishDate 2015
url http://ir.unimas.my/id/eprint/13739/1/Norhuzaimin.pdf
http://ir.unimas.my/id/eprint/13739/
http://www.jaspe.unimas.my/index.php/features/layouts?layout=edit&id=34
_version_ 1724078570964254720
score 13.188404

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