SOFT ERROR MITIGATION IN MEMORY SYSTEM

• Main Authors: Norhuzaimin, Julai, FARHANA, MOHAMAD ABDUL KADIR, Shamsiah, Suhaili
• Format: Article
• Language: English
• Published: School of Engineering, Taylor’s University 2023
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://ir.unimas.my/id/eprint/44786/1/SOFT%20ERROR.pdf; http://ir.unimas.my/id/eprint/44786/; https://jestec.taylors.edu.my/Vol%2018%20Issue%202%20April%202023/18_2_3.pdf

Technology downscaling has increased the sensitivity of circuitry to being corrupted by single event upsets. To provide more solutions for the issue, a method of error detection and correction is provided in this study. The double exponential model was used to simulate the single event upset current...