SOFT ERROR MITIGATION IN MEMORY SYSTEM
Technology downscaling has increased the sensitivity of circuitry to being corrupted by single event upsets. To provide more solutions for the issue, a method of error detection and correction is provided in this study. The double exponential model was used to simulate the single event upset current...
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| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
School of Engineering, Taylor’s University
2023
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| Subjects: | |
| Online Access: | http://ir.unimas.my/id/eprint/44786/1/SOFT%20ERROR.pdf http://ir.unimas.my/id/eprint/44786/ https://jestec.taylors.edu.my/Vol%2018%20Issue%202%20April%202023/18_2_3.pdf |
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