CdS film thickness characterization by R.F. magnetron sputtering

• المؤلفون الرئيسيون: Uda, Hashim, Prof. Dr., Kasim, Abdul Rahman, Hakim, Mohd Azri, Othman
• التنسيق: Working Paper
• اللغة: English
• منشور في: American Institute of Physics 2010
• الموضوعات: Cadmium sulphide (CdS); Resistivity; RF magnetron sputtering; X-ray diffraction; Malaysian Technical Universities Conference on Engineering and Technology (MUCEET)
• الوصول للمادة أونلاين: http://dspace.unimap.edu.my/xmlui/handle/123456789/8795

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