CdS film thickness characterization by R.F. magnetron sputtering

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Bibliographic Details
Main Authors: Uda, Hashim, Prof. Dr., Kasim, Abdul Rahman, Hakim, Mohd Azri, Othman
Format: Working Paper
Language:English
Published: American Institute of Physics 2010
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Online Access:http://dspace.unimap.edu.my/xmlui/handle/123456789/8795
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