Comments: CdS film thickness characterization by R.F. magnetron sputtering

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Bibliographic Details
Main Authors:	Uda, Hashim, Prof. Dr., Kasim, Abdul Rahman, Hakim, Mohd Azri, Othman
Format:	Working Paper
Language:	English
Published:	American Institute of Physics 2010
Subjects:	Cadmium sulphide (CdS) Resistivity RF magnetron sputtering X-ray diffraction Malaysian Technical Universities Conference on Engineering and Technology (MUCEET)
Online Access:	http://dspace.unimap.edu.my/xmlui/handle/123456789/8795
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