Influence of shear strength on long term biased humidity reliability of Cu ball bonds

• Main Authors: Chong, Leong Gan, Uda, Hashim, Prof. Dr.
• Other Authors: [e-mail]
• Format: Article
• Language: English
• Published: Springer Science+Business Media New York 2015
• Subjects: Bond lifetime; Failure rate; Reliability data; Secondary electron microscopy
• Online Access: http://dspace.unimap.edu.my:80/xmlui/handle/123456789/39431

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