Lattice Imperfections in Intermetallic Ti-Al alloys: an X-Ray Diffraction study of the microstructure by the Rietveld method

Microstructure in intermetallic Ti-Al alloys with compositions of Al= 45, 50, 55, and 60% in the homogenized bulk states has been extensively studied using Rietveld whole X-ray profile fitting technique, adopting the recently developed softwares, C-Rietan2000 and MAUD (Material Analysis Using Diffr...

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Bibliographic Details
Main Author: Lee Liu Mei
Other Authors: Muhammad Asri Idris (Advisor)
Format: Learning Object
Language:English
Published: Universiti Malaysia Perlis 2008
Subjects:
Online Access:http://dspace.unimap.edu.my/xmlui/handle/123456789/3387
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