Wire bond shear test simulation on hemispherical surface bond pad

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Main Authors: Zaliman, Sauli, Dr., Retnasamy, Vithyacharan, Wan Mokhzani, Wan Norhaimi, Johari, Adnan, Assc. Prof. Dr., Palianysamy, Moganraj
Other Authors: W.M.W. Norhaimi, J. Adnan, M. Palianysamy
Format: Article
Language:English
Published: Trans Tech Publications 2014
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Online Access:http://dspace.unimap.edu.my:80/dspace/handle/123456789/32646
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spelling my.unimap-326462014-03-13T03:35:46Z Wire bond shear test simulation on hemispherical surface bond pad Zaliman, Sauli, Dr. Retnasamy, Vithyacharan Wan Mokhzani, Wan Norhaimi Johari, Adnan, Assc. Prof. Dr. Palianysamy, Moganraj W.M.W. Norhaimi, J. Adnan, M. Palianysamy vc.sundress@gmail.com ANSYS Hemisphere surface bond pad Shear test Wire bond Link to publisher's homepage at http://www.ttp.net/ Wire bonding process is an interconnection method adopted in the semiconductor packaging manufactory. One of the method used to assess the reliability and bond strength of the bonded wires are wire bond shear test .In this study, simulation on wire bond shear test is done to evaluate the stress response of the bonded wire when sheared on a hemispherical surface bond pad. The contrast between three types of wire material:gold(Au), aluminum(Al) and copper(Cu) were carry out to examine the effects of wire material on the stress response of bonded wire during wire bond shear test. The simulation results showed that copper wire bond induces highest stress and gold wire exhibits the least stress response. 2014-03-13T03:32:11Z 2014-03-13T03:32:11Z 2012-12 Article Advanced Materials Research, vol.262-623, 2012, pages 643-646 1662-8985 http://dspace.unimap.edu.my:80/dspace/handle/123456789/32646 http://www.scientific.net/AMR.622-623.643 en Trans Tech Publications
institution Universiti Malaysia Perlis
building UniMAP Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Malaysia Perlis
content_source UniMAP Library Digital Repository
url_provider http://dspace.unimap.edu.my/
language English
topic ANSYS
Hemisphere surface bond pad
Shear test
Wire bond
spellingShingle ANSYS
Hemisphere surface bond pad
Shear test
Wire bond
Zaliman, Sauli, Dr.
Retnasamy, Vithyacharan
Wan Mokhzani, Wan Norhaimi
Johari, Adnan, Assc. Prof. Dr.
Palianysamy, Moganraj
Wire bond shear test simulation on hemispherical surface bond pad
description Link to publisher's homepage at http://www.ttp.net/
author2 W.M.W. Norhaimi, J. Adnan, M. Palianysamy
author_facet W.M.W. Norhaimi, J. Adnan, M. Palianysamy
Zaliman, Sauli, Dr.
Retnasamy, Vithyacharan
Wan Mokhzani, Wan Norhaimi
Johari, Adnan, Assc. Prof. Dr.
Palianysamy, Moganraj
format Article
author Zaliman, Sauli, Dr.
Retnasamy, Vithyacharan
Wan Mokhzani, Wan Norhaimi
Johari, Adnan, Assc. Prof. Dr.
Palianysamy, Moganraj
author_sort Zaliman, Sauli, Dr.
title Wire bond shear test simulation on hemispherical surface bond pad
title_short Wire bond shear test simulation on hemispherical surface bond pad
title_full Wire bond shear test simulation on hemispherical surface bond pad
title_fullStr Wire bond shear test simulation on hemispherical surface bond pad
title_full_unstemmed Wire bond shear test simulation on hemispherical surface bond pad
title_sort wire bond shear test simulation on hemispherical surface bond pad
publisher Trans Tech Publications
publishDate 2014
url http://dspace.unimap.edu.my:80/dspace/handle/123456789/32646
_version_ 1643796940536676352
score 13.222552