Capacity Benefit Margin (CBM) assessment incorporating tie-line reliability

• Main Authors: Nurulazmi, Abd Rahman, Muhammad Murtadha, Othman, Ismail, Musirin, Azah, Mohamed, Aini, Hussain
• Other Authors: [e-mail]
• Format: Working Paper
• Language: English
• Published: Institute of Electrical and Electronics Engineers (IEEE) 2011
• Subjects: Available transfer capability; Capacity benefit margin; Reliability of interconnected system
• Online Access: http://dspace.unimap.edu.my/xmlui/handle/123456789/10434

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