Characterization of pMosfet degradation in negative bias temperature instability test / Soon Foo Yew

• Main Author: Soon, Foo Yew
• Format: Thesis
• Published: 2012
• Subjects: T Technology (General); TA Engineering (General). Civil engineering (General)
• Online Access: http://studentsrepo.um.edu.my/8383/6/Dissertation%2DNBTI%2DFinal.pdf; http://studentsrepo.um.edu.my/8383/

Threshold voltage instability has become a major IC reliability concern for sub-micron CMOS process technology. In the past, VTH Stability test is commonly used by the wafer fabrication plant to have a quick assessment on this reliability concern during process qualification, due to its simple te...