NEGATIVE BIAS TEMPERATURE INSTABILITY STUDIES FOR ANALOG SOC CIRCUITS
Negative Bias Temperature Instability (NBTI) is one of the recent reliability issues in sub threshold CMOS circuits. NBTI effect on analog circuits, which require matched device pairs and mismatches, will cause circuit failure. This work is to assess the NBTI effect considering the voltage and th...
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| Format: | Thesis |
| Language: | English |
| Published: |
2012
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| Online Access: | http://utpedia.utp.edu.my/8955/1/2012%20Master%20-%20Negative%20Bias%20Temperature%20Instability%20studies%20For%20Analog%20SOC%20Circuits.pdf http://utpedia.utp.edu.my/8955/ |
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