Effects of concentration of adipic acid on the electrochemical migration of tin for printed circuit board assembly

The continuous advancement in innovative electronic applications leads to closer interconnection spacing and higher electric field density, thus increasing the risk of electrochemical migration (ECM)-related failures. The ECM of tin (Sn) attracts great interest due to the wide use of Sn on the surfa...

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Bibliographic Details
Main Authors: Goh, Yi Sing, Haseeb, A. S. M. A., Basirun, Wan Jeffrey, Wong, Yew Hoong, Sabri, Mohd Faizul Mohd, Low, Boon Yew
Format: Article
Published: Springer 2023
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Online Access:http://eprints.um.edu.my/38834/
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