Some structural parameters of ZnSxSe1−x thin films prepared by electron beam evaporation

• Main Authors: Abo-Hassan, Khedr M.M., Muhamad, Muhamad Rasat, Radhakrishna, S.
• Format: Article
• Published: Elsevier 2005
• Subjects: Q Science (General); QC Physics
• Online Access: http://eprints.um.edu.my/24460/; https://doi.org/10.1016/j.physb.2005.01.422

ZnSxSe1-x thin films were prepared by electron beam evaporation. The samples were investigated by using energy dispersion X-ray analysis (EDXA), scanning electron microscopy (SEM) and X-ray diffraction (XRD). The results implied that the film composition deviates from the theoretical stoichiometric...