Some structural parameters of ZnSxSe1−x thin films prepared by electron beam evaporation
ZnSxSe1-x thin films were prepared by electron beam evaporation. The samples were investigated by using energy dispersion X-ray analysis (EDXA), scanning electron microscopy (SEM) and X-ray diffraction (XRD). The results implied that the film composition deviates from the theoretical stoichiometric...
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Main Authors: | , , |
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Format: | Article |
Published: |
Elsevier
2005
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Online Access: | http://eprints.um.edu.my/24460/ https://doi.org/10.1016/j.physb.2005.01.422 |
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