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Some structural parameters of ZnSxSe1−x thin films prepared by electron beam evaporation

ZnSxSe1-x thin films were prepared by electron beam evaporation. The samples were investigated by using energy dispersion X-ray analysis (EDXA), scanning electron microscopy (SEM) and X-ray diffraction (XRD). The results implied that the film composition deviates from the theoretical stoichiometric...

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Main Authors: Abo-Hassan, Khedr M.M., Muhamad, Muhamad Rasat, Radhakrishna, S.
Format: Article
Published: Elsevier 2005
Subjects:
Q Science (General)
QC Physics
Online Access:http://eprints.um.edu.my/24460/
https://doi.org/10.1016/j.physb.2005.01.422
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spelling my.um.eprints.244602020-05-29T01:49:10Z http://eprints.um.edu.my/24460/ Some structural parameters of ZnSxSe1−x thin films prepared by electron beam evaporation Abo-Hassan, Khedr M.M. Muhamad, Muhamad Rasat Radhakrishna, S. Q Science (General) QC Physics ZnSxSe1-x thin films were prepared by electron beam evaporation. The samples were investigated by using energy dispersion X-ray analysis (EDXA), scanning electron microscopy (SEM) and X-ray diffraction (XRD). The results implied that the film composition deviates from the theoretical stoichiometric and that excess of S was formed as grain boundaries. The XRD profiles showed that the films are polycrystalline with cubic structure grown preferentially along the 〈1 1 1〉 axis. The lattice parameter of the cubic structure varied linearly with the film composition according to Vegard's Law. Most of the samples experienced tensile stress while some of them exhibited compressive stress. © 2005 Elsevier B.V. All rights reserved. Elsevier 2005 Article PeerReviewed Abo-Hassan, Khedr M.M. and Muhamad, Muhamad Rasat and Radhakrishna, S. (2005) Some structural parameters of ZnSxSe1−x thin films prepared by electron beam evaporation. Physica B: Condensed Matter, 358 (1-4). pp. 256-264. ISSN 0921-4526 https://doi.org/10.1016/j.physb.2005.01.422 doi:10.1016/j.physb.2005.01.422
institution Universiti Malaya
building UM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Malaya
content_source UM Research Repository
url_provider http://eprints.um.edu.my/
topic Q Science (General)
QC Physics
spellingShingle Q Science (General)
QC Physics
Abo-Hassan, Khedr M.M.
Muhamad, Muhamad Rasat
Radhakrishna, S.
Some structural parameters of ZnSxSe1−x thin films prepared by electron beam evaporation
description ZnSxSe1-x thin films were prepared by electron beam evaporation. The samples were investigated by using energy dispersion X-ray analysis (EDXA), scanning electron microscopy (SEM) and X-ray diffraction (XRD). The results implied that the film composition deviates from the theoretical stoichiometric and that excess of S was formed as grain boundaries. The XRD profiles showed that the films are polycrystalline with cubic structure grown preferentially along the 〈1 1 1〉 axis. The lattice parameter of the cubic structure varied linearly with the film composition according to Vegard's Law. Most of the samples experienced tensile stress while some of them exhibited compressive stress. © 2005 Elsevier B.V. All rights reserved.
format Article
author Abo-Hassan, Khedr M.M.
Muhamad, Muhamad Rasat
Radhakrishna, S.
author_facet Abo-Hassan, Khedr M.M.
Muhamad, Muhamad Rasat
Radhakrishna, S.
author_sort Abo-Hassan, Khedr M.M.
title Some structural parameters of ZnSxSe1−x thin films prepared by electron beam evaporation
title_short Some structural parameters of ZnSxSe1−x thin films prepared by electron beam evaporation
title_full Some structural parameters of ZnSxSe1−x thin films prepared by electron beam evaporation
title_fullStr Some structural parameters of ZnSxSe1−x thin films prepared by electron beam evaporation
title_full_unstemmed Some structural parameters of ZnSxSe1−x thin films prepared by electron beam evaporation
title_sort some structural parameters of znsxse1−x thin films prepared by electron beam evaporation
publisher Elsevier
publishDate 2005
url http://eprints.um.edu.my/24460/
https://doi.org/10.1016/j.physb.2005.01.422
_version_ 1669008003261530112
score 13.159267

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