Ammonia flux tailoring on the quality of AlN epilayers grown by pulsed atomic-layer epitaxy techniques on (0 0 0 1)-oriented sapphire substrates via MOCVD

A smooth and dense surface of single-crystalline aluminium nitride thin films has been epitaxially grown on (0 0 0 1)-sapphire substrates by tailoring and optimizing the ammonia flux density during deposition. The aluminium nitride films were deposited by metal organic chemical vapour deposition usi...

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Bibliographic Details
Main Authors: Abd Rahman, Mohd Nazri, Talik, Noor Azrina, Abdul Khudus, Muhammad Imran Mustafa, Sulaiman, Abdullah Fadil, Allif, Kamarul, Zahir, Norhilmi Mohd, Shuhaimi, Ahmad
Format: Article
Published: Royal Society of Chemistry 2019
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Online Access:http://eprints.um.edu.my/24246/
https://doi.org/10.1039/C9CE00014C
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