Diagonal control design for atomic force microscope piezoelectric tube nanopositioners

• Main Authors: Bhikkaji, Bharath, Yong, Yuen Kuan, Mahmood, Iskandar Al-Thani, Moheimani, S.O. Reza
• Format: Article
• Language: English
• Published: American Institute of Physics (AIP) 2013
• Subjects: Q Science (General); TJ212 Control engineering
• Online Access: http://irep.iium.edu.my/29069/1/Journal%23_RSI_Diagonal_control_design_for_atomic_force_microscope_piezoelectric_tube_nanopositioners.pdf; http://irep.iium.edu.my/29069/; http://rsi.aip.org/resource/1/rsinak/v84/i2/p023705_s1?isAuthorized=no

Atomic Force Microscopes (AFM) are used for generating surface topography of samples at micro to atomic resolutions. Many commercial AFMs use piezoelectric tube nanopositioners for scanning. Scanning rates of these microscopes are hampered by the presence of low frequency resonant modes. When inadve...