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Statistical NBTI-effect prediction for ULSI circuits

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Main Authors: Tang, Tong Boon, Murray, Alan F, Cheng, Binjie, Asenov, Asen
Format: Conference or Workshop Item
Published: 2010
Online Access:http://scholars.utp.edu.my/id/eprint/36595/
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spelling oai:scholars.utp.edu.my:365952023-06-19T04:19:04Z http://scholars.utp.edu.my/id/eprint/36595/ Statistical NBTI-effect prediction for ULSI circuits Tang, Tong Boon Murray, Alan F Cheng, Binjie Asenov, Asen 2010 Conference or Workshop Item NonPeerReviewed Tang, Tong Boon and Murray, Alan F and Cheng, Binjie and Asenov, Asen (2010) Statistical NBTI-effect prediction for ULSI circuits. In: Proceedings of 2010 IEEE International Symposium on Circuits and Systems.
institution Universiti Teknologi Petronas
building UTP Resource Centre
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Petronas
content_source UTP Institutional Repository
url_provider http://eprints.utp.edu.my/
format Conference or Workshop Item
author Tang, Tong Boon
Murray, Alan F
Cheng, Binjie
Asenov, Asen
spellingShingle Tang, Tong Boon
Murray, Alan F
Cheng, Binjie
Asenov, Asen
Statistical NBTI-effect prediction for ULSI circuits
author_facet Tang, Tong Boon
Murray, Alan F
Cheng, Binjie
Asenov, Asen
author_sort Tang, Tong Boon
title Statistical NBTI-effect prediction for ULSI circuits
title_short Statistical NBTI-effect prediction for ULSI circuits
title_full Statistical NBTI-effect prediction for ULSI circuits
title_fullStr Statistical NBTI-effect prediction for ULSI circuits
title_full_unstemmed Statistical NBTI-effect prediction for ULSI circuits
title_sort statistical nbti-effect prediction for ulsi circuits
publishDate 2010
url http://scholars.utp.edu.my/id/eprint/36595/
_version_ 1769845528726601728
score 13.214268

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