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Solution of Peak Junction Temperature with Crank-Nicolson and SOR Approach

The junction temperatures (JT) of many microelectronic devices have been reduced in order to improve device reliability and extend operating life. When the JT exceeds a certain threshold, electronic devices can suffer irreversible damage. As a result, a thermal control system can be used to achieve...

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Main Authors: Aruchunan, E., Siri, Z., Aziz, M.H.B.N., Wahab, M.H.B.A., Muthuvalu, M.S., Sulaiman, J.
格式: Article
出版: Springer Science and Business Media Deutschland GmbH 2022
在線閱讀:http://scholars.utp.edu.my/id/eprint/34092/
https://www.scopus.com/inward/record.uri?eid=2-s2.0-85140222068&doi=10.1007%2f978-3-031-04028-3_15&partnerID=40&md5=be57e74a110d642094e4c029385cb304
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