Solution of Peak Junction Temperature with Crank-Nicolson and SOR Approach
The junction temperatures (JT) of many microelectronic devices have been reduced in order to improve device reliability and extend operating life. When the JT exceeds a certain threshold, electronic devices can suffer irreversible damage. As a result, a thermal control system can be used to achieve...
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| Main Authors: | , , , , , |
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| Format: | Article |
| Published: |
Springer Science and Business Media Deutschland GmbH
2022
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| Online Access: | http://scholars.utp.edu.my/id/eprint/34092/ https://www.scopus.com/inward/record.uri?eid=2-s2.0-85140222068&doi=10.1007%2f978-3-031-04028-3_15&partnerID=40&md5=be57e74a110d642094e4c029385cb304 |
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