Solution of Peak Junction Temperature with Crank-Nicolson and SOR Approach

• Main Authors: Aruchunan, E., Siri, Z., Aziz, M.H.B.N., Wahab, M.H.B.A., Muthuvalu, M.S., Sulaiman, J.
• Format: Article
• Published: Springer Science and Business Media Deutschland GmbH 2022
• Online Access: http://scholars.utp.edu.my/id/eprint/34092/; https://www.scopus.com/inward/record.uri?eid=2-s2.0-85140222068&doi=10.1007%2f978-3-031-04028-3_15&partnerID=40&md5=be57e74a110d642094e4c029385cb304

The junction temperatures (JT) of many microelectronic devices have been reduced in order to improve device reliability and extend operating life. When the JT exceeds a certain threshold, electronic devices can suffer irreversible damage. As a result, a thermal control system can be used to achieve...