Fault Modeling of Analog Circuits Using System Identification Automated Model Generation Approaches from SPICE level Descriptions

Fault modeling and simulation (FMAS) of analog circuits is considered to be time consuming and expensive as compared to digital circuits. FMAS of analog circuits is heavily dependent on transistor level (TL) circuits and slow speed of TL fault simulation (TLFS) increase overall testing cost. Therefo...

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主要な著者: Xia, Likun, Faroop, M. Umer, Hussin, Fawnizu Azmadi, Malik, Aamir Saeed
フォーマット: 論文
出版事項: American Scientific Publishers 2012
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オンライン・アクセス:http://eprints.utp.edu.my/8437/1/ICAEE2012_210.pdf
http://www.aspbs.com/science.htm
http://eprints.utp.edu.my/8437/
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