Non-destructive characterization of dielectric materials by microwave spectroscopy in LS band

• Main Authors: Jilani, M.T., Cheong, L.Y., Saand, A.S., Wen, W.P., Rehman, M.Z.U.
• Format: Article
• Published: National Institute of Optoelectronics 2016
• Online Access: https://www.scopus.com/inward/record.uri?eid=2-s2.0-84989339646&partnerID=40&md5=863c2b8383a07d0628a8aee5b9f9894a; http://eprints.utp.edu.my/25603/

The paper describes the characterization of dielectric materials, by using a resonance based ring-resonator method. A microstrip ring resonator (MRR) method is presented to measure effective dielectric constant (ϵreff) of composite laminate materials. Multilayer structure of MRR is designed and sim...