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Non-destructive characterization of dielectric materials by microwave spectroscopy in LS band

The paper describes the characterization of dielectric materials, by using a resonance based ring-resonator method. A microstrip ring resonator (MRR) method is presented to measure effective dielectric constant (ϵreff) of composite laminate materials. Multilayer structure of MRR is designed and sim...

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Main Authors: Jilani, M.T., Cheong, L.Y., Saand, A.S., Wen, W.P., Rehman, M.Z.U.
Format: Article
Published: National Institute of Optoelectronics 2016
Online Access:https://www.scopus.com/inward/record.uri?eid=2-s2.0-84989339646&partnerID=40&md5=863c2b8383a07d0628a8aee5b9f9894a
http://eprints.utp.edu.my/25603/
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spelling my.utp.eprints.256032021-08-27T09:59:29Z Non-destructive characterization of dielectric materials by microwave spectroscopy in LS band Jilani, M.T. Cheong, L.Y. Saand, A.S. Wen, W.P. Rehman, M.Z.U. The paper describes the characterization of dielectric materials, by using a resonance based ring-resonator method. A microstrip ring resonator (MRR) method is presented to measure effective dielectric constant (ϵreff) of composite laminate materials. Multilayer structure of MRR is designed and simulated using Ansoft's High Frequency Structure Simulation. Comparative study of polytetrafluoroethylene (PTFE), ceramic and ceramic-PTFE composites have been carried out to analyze the åreff along with its dependence on sheet thickness. From results, it is clearly observed that as the thickness of overlay is increased there is significant change in effective permittivity, which is more noticeable for high-permittivity ceramic material than low-permittivity PTFE material. Measured data is found in good agreement with the reported data. National Institute of Optoelectronics 2016 Article NonPeerReviewed https://www.scopus.com/inward/record.uri?eid=2-s2.0-84989339646&partnerID=40&md5=863c2b8383a07d0628a8aee5b9f9894a Jilani, M.T. and Cheong, L.Y. and Saand, A.S. and Wen, W.P. and Rehman, M.Z.U. (2016) Non-destructive characterization of dielectric materials by microwave spectroscopy in LS band. Journal of Optoelectronics and Advanced Materials, 18 (5-6). pp. 589-594. http://eprints.utp.edu.my/25603/
institution Universiti Teknologi Petronas
building UTP Resource Centre
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Petronas
content_source UTP Institutional Repository
url_provider http://eprints.utp.edu.my/
description The paper describes the characterization of dielectric materials, by using a resonance based ring-resonator method. A microstrip ring resonator (MRR) method is presented to measure effective dielectric constant (ϵreff) of composite laminate materials. Multilayer structure of MRR is designed and simulated using Ansoft's High Frequency Structure Simulation. Comparative study of polytetrafluoroethylene (PTFE), ceramic and ceramic-PTFE composites have been carried out to analyze the åreff along with its dependence on sheet thickness. From results, it is clearly observed that as the thickness of overlay is increased there is significant change in effective permittivity, which is more noticeable for high-permittivity ceramic material than low-permittivity PTFE material. Measured data is found in good agreement with the reported data.
format Article
author Jilani, M.T.
Cheong, L.Y.
Saand, A.S.
Wen, W.P.
Rehman, M.Z.U.
spellingShingle Jilani, M.T.
Cheong, L.Y.
Saand, A.S.
Wen, W.P.
Rehman, M.Z.U.
Non-destructive characterization of dielectric materials by microwave spectroscopy in LS band
author_facet Jilani, M.T.
Cheong, L.Y.
Saand, A.S.
Wen, W.P.
Rehman, M.Z.U.
author_sort Jilani, M.T.
title Non-destructive characterization of dielectric materials by microwave spectroscopy in LS band
title_short Non-destructive characterization of dielectric materials by microwave spectroscopy in LS band
title_full Non-destructive characterization of dielectric materials by microwave spectroscopy in LS band
title_fullStr Non-destructive characterization of dielectric materials by microwave spectroscopy in LS band
title_full_unstemmed Non-destructive characterization of dielectric materials by microwave spectroscopy in LS band
title_sort non-destructive characterization of dielectric materials by microwave spectroscopy in ls band
publisher National Institute of Optoelectronics
publishDate 2016
url https://www.scopus.com/inward/record.uri?eid=2-s2.0-84989339646&partnerID=40&md5=863c2b8383a07d0628a8aee5b9f9894a
http://eprints.utp.edu.my/25603/
_version_ 1738656753516544000
score 13.160551

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