Non-destructive characterization of dielectric materials by microwave spectroscopy in LS band
The paper describes the characterization of dielectric materials, by using a resonance based ring-resonator method. A microstrip ring resonator (MRR) method is presented to measure effective dielectric constant (ϵreff) of composite laminate materials. Multilayer structure of MRR is designed and sim...
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Main Authors: | , , , , |
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Format: | Article |
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National Institute of Optoelectronics
2016
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Online Access: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-84989339646&partnerID=40&md5=863c2b8383a07d0628a8aee5b9f9894a http://eprints.utp.edu.my/25603/ |
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