A self-adaptive class-imbalance TSK neural network with applications to semiconductor defects detection

• Main Authors: Tan, S.C., Wang, S., Watada, J.
• Format: Article
• Published: Elsevier Inc. 2018
• Online Access: https://www.scopus.com/inward/record.uri?eid=2-s2.0-85032186655&doi=10.1016%2fj.ins.2017.10.040&partnerID=40&md5=fefe70c2341a3f89d2d12059cf151c29; http://eprints.utp.edu.my/21815/

This paper develops a hybrid approach integrating an adaptive artificial neural network (ANN) and a fuzzy logic system for tackling class-imbalance problems. In particular, a supervised learning ANN based on Adaptive Resonance Theory (ART) is combined with a Tagaki�Sugeno�Kang-based fuzzy infere...