A Hybrid Delay Design-for-Testability for Nonseparable RTL Controller-Data path Circuits
Path delay testing has become crucial nowadays due to the advancement in process technology. Only enhanced scan (ES) among the scan approaches provides a solution to test the path delay fault (PDF) with large area overhead and the long test application time. This paper proposes a hybrid DFT method f...
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| Main Authors: | , , |
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| Format: | Article |
| Published: |
World Scientific
2017
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| Online Access: | http://eprints.utp.edu.my/11929/1/s0218126617500219.pdf http://eprints.utp.edu.my/11929/ |
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