An efficient march (5n) FSM-based Memory Built-in Self-Test (MBIST) architecture with diagnosis capabilities

• Main Author: Ng, Kok Heng
• Format: Thesis
• Language: English
• Published: 2022
• Subjects: TK Electrical engineering. Electronics Nuclear engineering
• Online Access: http://eprints.utm.my/id/eprint/99546/1/NgKokHengMSKE2022.pdf; http://eprints.utm.my/id/eprint/99546/; http://dms.library.utm.my:8080/vital/access/manager/Repository/vital:149961

In deep submicron Systems-on-Chip, embedded memories are consuming a growing part of the die area. The manufacturing test of embedded memory is a critical stage in the SoC production process that screens out faulty chips and speeds up the volume production of new manufacturing technology. Memory Bui...