Effect of sm on yig: structural and dielectric properties evaluation

This work aims to identify the effect of samarium (Sm) doped in YIG by using conventional solid-state reaction. The investigation was carried based on 2Y 3-x Sm x Fe 5 O 12 (Sm x ; x = 0.1-1.5). It is found that from X-ray diffraction analysis (XRD) associated with Rietveld refinement, secondary pha...

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Bibliographic Details
Main Authors: Ahmad, H. H., Rejab, N. A., Ahmad, Z. A., Ain, M. F., Othman, M., Ali, W. F. F. W.
Format: Conference or Workshop Item
Published: 2019
Subjects:
Online Access:http://eprints.utm.my/id/eprint/88770/
https://dx.doi.org/10.1063/1.5089411
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