Effect of sm on yig: structural and dielectric properties evaluation
This work aims to identify the effect of samarium (Sm) doped in YIG by using conventional solid-state reaction. The investigation was carried based on 2Y 3-x Sm x Fe 5 O 12 (Sm x ; x = 0.1-1.5). It is found that from X-ray diffraction analysis (XRD) associated with Rietveld refinement, secondary pha...
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| Main Authors: | , , , , , |
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| Format: | Conference or Workshop Item |
| Published: |
2019
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| Subjects: | |
| Online Access: | http://eprints.utm.my/id/eprint/88770/ https://dx.doi.org/10.1063/1.5089411 |
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| Summary: | This work aims to identify the effect of samarium (Sm) doped in YIG by using conventional solid-state reaction. The investigation was carried based on 2Y 3-x Sm x Fe 5 O 12 (Sm x ; x = 0.1-1.5). It is found that from X-ray diffraction analysis (XRD) associated with Rietveld refinement, secondary phases such as YIP/SIP, hematite and yttria were detected. The presence of Sm also has a significant effect on the YIG's grain size (range 3.798μm - 7.131μm). For dielectric properties of doped YIG measured from 1GHz-20GHz has enhanced the dielectric constant (ϵr) from 15.4 to 17.5. |
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