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Effect of sm on yig: structural and dielectric properties evaluation

This work aims to identify the effect of samarium (Sm) doped in YIG by using conventional solid-state reaction. The investigation was carried based on 2Y 3-x Sm x Fe 5 O 12 (Sm x ; x = 0.1-1.5). It is found that from X-ray diffraction analysis (XRD) associated with Rietveld refinement, secondary pha...

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Main Authors: Ahmad, H. H., Rejab, N. A., Ahmad, Z. A., Ain, M. F., Othman, M., Ali, W. F. F. W.
Format: Conference or Workshop Item
Published: 2019
Subjects:
TJ Mechanical engineering and machinery
Online Access:http://eprints.utm.my/id/eprint/88770/
https://dx.doi.org/10.1063/1.5089411
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spelling my.utm.887702020-12-29T04:19:08Z http://eprints.utm.my/id/eprint/88770/ Effect of sm on yig: structural and dielectric properties evaluation Ahmad, H. H. Rejab, N. A. Ahmad, Z. A. Ain, M. F. Othman, M. Ali, W. F. F. W. TJ Mechanical engineering and machinery This work aims to identify the effect of samarium (Sm) doped in YIG by using conventional solid-state reaction. The investigation was carried based on 2Y 3-x Sm x Fe 5 O 12 (Sm x ; x = 0.1-1.5). It is found that from X-ray diffraction analysis (XRD) associated with Rietveld refinement, secondary phases such as YIP/SIP, hematite and yttria were detected. The presence of Sm also has a significant effect on the YIG's grain size (range 3.798μm - 7.131μm). For dielectric properties of doped YIG measured from 1GHz-20GHz has enhanced the dielectric constant (ϵr) from 15.4 to 17.5. 2019 Conference or Workshop Item PeerReviewed Ahmad, H. H. and Rejab, N. A. and Ahmad, Z. A. and Ain, M. F. and Othman, M. and Ali, W. F. F. W. (2019) Effect of sm on yig: structural and dielectric properties evaluation. In: International Conference on X-Rays and Related Techniques in Research and Industry 2018, ICXRI 2018, 18-19 Aug 2018, Grand Riverview Hotel Kota Bharu, Kelantan, Malaysia. https://dx.doi.org/10.1063/1.5089411
institution Universiti Teknologi Malaysia
building UTM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Malaysia
content_source UTM Institutional Repository
url_provider http://eprints.utm.my/
topic TJ Mechanical engineering and machinery
spellingShingle TJ Mechanical engineering and machinery
Ahmad, H. H.
Rejab, N. A.
Ahmad, Z. A.
Ain, M. F.
Othman, M.
Ali, W. F. F. W.
Effect of sm on yig: structural and dielectric properties evaluation
description This work aims to identify the effect of samarium (Sm) doped in YIG by using conventional solid-state reaction. The investigation was carried based on 2Y 3-x Sm x Fe 5 O 12 (Sm x ; x = 0.1-1.5). It is found that from X-ray diffraction analysis (XRD) associated with Rietveld refinement, secondary phases such as YIP/SIP, hematite and yttria were detected. The presence of Sm also has a significant effect on the YIG's grain size (range 3.798μm - 7.131μm). For dielectric properties of doped YIG measured from 1GHz-20GHz has enhanced the dielectric constant (ϵr) from 15.4 to 17.5.
format Conference or Workshop Item
author Ahmad, H. H.
Rejab, N. A.
Ahmad, Z. A.
Ain, M. F.
Othman, M.
Ali, W. F. F. W.
author_facet Ahmad, H. H.
Rejab, N. A.
Ahmad, Z. A.
Ain, M. F.
Othman, M.
Ali, W. F. F. W.
author_sort Ahmad, H. H.
title Effect of sm on yig: structural and dielectric properties evaluation
title_short Effect of sm on yig: structural and dielectric properties evaluation
title_full Effect of sm on yig: structural and dielectric properties evaluation
title_fullStr Effect of sm on yig: structural and dielectric properties evaluation
title_full_unstemmed Effect of sm on yig: structural and dielectric properties evaluation
title_sort effect of sm on yig: structural and dielectric properties evaluation
publishDate 2019
url http://eprints.utm.my/id/eprint/88770/
https://dx.doi.org/10.1063/1.5089411
_version_ 1687393619306086400
score 13.18916

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