Ballistic mobility and saturation velocity in low-dimensional nanostructures

Ohm's law, a linear drift velocity response to the applied electric field, has been and continues to be the basis for characterizing, evaluating performance, and designing integrated circuits, but is shown not to hold its supremacy as channel lengths are being scaled down. In the high electric...

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書誌詳細
主要な著者: Saad, Ismail, Tan, Michael Loong Peng, Ing, Hui Hii, Ismail, Razali, Arora, Vijay Kumar
フォーマット: 論文
言語:English
出版事項: Elsevier 2009
主題:
オンライン・アクセス:http://eprints.utm.my/id/eprint/7505/3/IsmailSaad2009_BallisticMobilityandSaturationVelocity.pdf
http://eprints.utm.my/id/eprint/7505/
http://dx.doi.org/10.1016/j.mejo.2008.06.046
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