Study on the AFM force curve common errors and their effects on the calculated nanomechanical properties of materials

The atomic force microscope (AFM) force curve has been widely used for determining the mechanical properties of materials due to its high resolution, whereby very low (piconewton) forces and distances as small as nanometers can be measured. However, sometimes the resultant force curve obtained from...

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Bibliographic Details
Main Authors: Almasi, D., Sharifi, R., Abdul Kadir, M. R., Krishnamurithy, G., Kamarul, T.
Format: Article
Language:English
Published: Hindawi Limited 2016
Subjects:
Online Access:http://eprints.utm.my/id/eprint/70597/1/D.Almasi2016_StudyontheAFMforcecurve.pdf
http://eprints.utm.my/id/eprint/70597/
http://dx.doi.org/10.1155/2016/2456378
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