A review of computational damage mechanics of mass transport in solder joint

Motivated by the requirement of International Technology Roadmap for Semiconductors (ITRS), this article addresses ITRS modelling and simulation requirements particularly electromigration and thermomigration. The governing equations, material and damage mechanics models are discussed, finite element...

Full description

Saved in:
Bibliographic Details
Main Authors: Hamid, M. F. A., Tamin, M. N.
Format: Conference or Workshop Item
Published: 2015
Subjects:
Online Access:http://eprints.utm.my/id/eprint/59117/
http://dx.doi.org/10.1109/IEMT.2014.7123121
Tags: Add Tag
No Tags, Be the first to tag this record!
Be the first to leave a comment!
You must be logged in first