A review of computational damage mechanics of mass transport in solder joint

Motivated by the requirement of International Technology Roadmap for Semiconductors (ITRS), this article addresses ITRS modelling and simulation requirements particularly electromigration and thermomigration. The governing equations, material and damage mechanics models are discussed, finite element...

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Main Authors: Hamid, M. F. A., Tamin, M. N.
Format: Conference or Workshop Item
Published: 2015
Subjects:
Online Access:http://eprints.utm.my/id/eprint/59117/
http://dx.doi.org/10.1109/IEMT.2014.7123121
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spelling my.utm.591172022-04-05T06:26:15Z http://eprints.utm.my/id/eprint/59117/ A review of computational damage mechanics of mass transport in solder joint Hamid, M. F. A. Tamin, M. N. TJ Mechanical engineering and machinery Motivated by the requirement of International Technology Roadmap for Semiconductors (ITRS), this article addresses ITRS modelling and simulation requirements particularly electromigration and thermomigration. The governing equations, material and damage mechanics models are discussed, finite element formulations are developed, and finally results from simulations and experiments are compared to validate simulation results. 2015 Conference or Workshop Item PeerReviewed Hamid, M. F. A. and Tamin, M. N. (2015) A review of computational damage mechanics of mass transport in solder joint. In: 2014 36th IEEE International Electronics Manufacturing Technology Conference, IEMT 2014, 11 - 13 November 2014, Johor, Malaysia. http://dx.doi.org/10.1109/IEMT.2014.7123121
institution Universiti Teknologi Malaysia
building UTM Library
collection Institutional Repository
continent Asia
country Malaysia
content_provider Universiti Teknologi Malaysia
content_source UTM Institutional Repository
url_provider http://eprints.utm.my/
topic TJ Mechanical engineering and machinery
spellingShingle TJ Mechanical engineering and machinery
Hamid, M. F. A.
Tamin, M. N.
A review of computational damage mechanics of mass transport in solder joint
description Motivated by the requirement of International Technology Roadmap for Semiconductors (ITRS), this article addresses ITRS modelling and simulation requirements particularly electromigration and thermomigration. The governing equations, material and damage mechanics models are discussed, finite element formulations are developed, and finally results from simulations and experiments are compared to validate simulation results.
format Conference or Workshop Item
author Hamid, M. F. A.
Tamin, M. N.
author_facet Hamid, M. F. A.
Tamin, M. N.
author_sort Hamid, M. F. A.
title A review of computational damage mechanics of mass transport in solder joint
title_short A review of computational damage mechanics of mass transport in solder joint
title_full A review of computational damage mechanics of mass transport in solder joint
title_fullStr A review of computational damage mechanics of mass transport in solder joint
title_full_unstemmed A review of computational damage mechanics of mass transport in solder joint
title_sort review of computational damage mechanics of mass transport in solder joint
publishDate 2015
url http://eprints.utm.my/id/eprint/59117/
http://dx.doi.org/10.1109/IEMT.2014.7123121
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score 13.211869