Electrical conductivity measurements in evaporated tin sulphide thin films
Tin sulphide (SnS) has been evaporated on to substrates maintained at fixed temperature in the range 50-300 oC. X-ray diffraction measurements have shown that the films deposited at the lower substrate temperatures are non-stoichiometric, containing higher sulphides of tin, but that those deposited...
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Main Authors: | Deraman, Karim, Sakrani, Samsudi, Ismail, B. B., Wahab, Yusof, Gould, R. D. |
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Format: | Article |
Language: | English |
Published: |
Taylor & Francis
1994
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Online Access: | http://eprints.utm.my/id/eprint/2620/1/international_jurnal_of_electronic.pdf http://eprints.utm.my/id/eprint/2620/ |
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